<i>SymBIST</i>: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST (SymBIST). SymBIST exploits inherent symmetries in an A/M-S IC to construct signals that are invariant by default, subsequently checks those against tolerance window. Violation of properties points the occurrence defect or abnormal operation. is designed serve as functional safety mechanism. It reusable ranging from post-manufacturing test, where it targets detection, on-line test field operation, low-latency detection transient failures degradation due aging. demonstrate on Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC). features high coverage, short time, low overhead, zero performance penalty, has fully digital interface making compatible with modern access mechanisms.